• DocumentCode
    3163282
  • Title

    A Fully Analytical MOSFET Model Parameter Extraction Approach

  • Author

    Tuinhout, Hans P. ; Swaving, Sieger ; Joosten, Jos J M

  • Author_Institution
    Philips Research Laboratories
  • fYear
    1988
  • fDate
    22-23 Feb. 1988
  • Firstpage
    79
  • Lastpage
    84
  • Keywords
    Analytical models; Design automation; Design engineering; MOSFET circuits; Parameter extraction; Process control; Production; Research and development; Semiconductor device modeling; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
  • Conference_Location
    Long Beach, CA, USA
  • Type

    conf

  • DOI
    10.1109/ICMTS.1988.672933
  • Filename
    672933
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3163282