• DocumentCode
    3163441
  • Title

    Determination Of The HF Model Parameters Of The MOS Transistor By Using Standard Dropin Test Structures

  • Author

    Vandeloo, P. ; Sansen, W.

  • Author_Institution
    Imec
  • fYear
    1988
  • fDate
    22-23 Feb. 1988
  • Firstpage
    97
  • Lastpage
    101
  • Keywords
    Capacitance; Circuit testing; Design engineering; Differential equations; Doping; Frequency measurement; Hafnium; MOSFETs; Measurement standards; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
  • Conference_Location
    Long Beach, CA, USA
  • Type

    conf

  • DOI
    10.1109/ICMTS.1988.672942
  • Filename
    672942
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3163441