• DocumentCode
    3163512
  • Title

    Guidelines For Latch-up Characterization Techniques

  • Author

    Reczek, W. ; Pribyl, W.

  • Author_Institution
    Siemens AG
  • fYear
    1988
  • fDate
    22-23 Feb. 1988
  • Firstpage
    120
  • Lastpage
    125
  • Keywords
    Bipolar transistors; Breakdown voltage; Capacitors; Circuit synthesis; Circuit testing; Guidelines; Inverters; Photoconductivity; Random access memory; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
  • Conference_Location
    Long Beach, CA, USA
  • Type

    conf

  • DOI
    10.1109/ICMTS.1988.672946
  • Filename
    672946
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3163512