• DocumentCode
    3163534
  • Title

    Test Circuit Structures For Characterizing The Effects Of Localized Hot-carrier-induced Charge In VLSI Switching Circuits

  • Author

    Suehle, J.S. ; Galloway, K.F.

  • Author_Institution
    National Bureau Of Standards
  • fYear
    1988
  • fDate
    22-23 Feb. 1988
  • Firstpage
    126
  • Lastpage
    131
  • Keywords
    Circuit testing; Degradation; Hot carrier effects; Hot carriers; Inverters; MOS devices; MOSFETs; Stress; Switching circuits; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
  • Conference_Location
    Long Beach, CA, USA
  • Type

    conf

  • DOI
    10.1109/ICMTS.1988.672947
  • Filename
    672947
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3163534