Title :
Wide-Band Characterization of Ferroelectric Thin-Films: Applications to KTN-based Microwave Agile Devices
Author :
Laur, Vincent ; Rousseau, Anthony ; Tanne, Gerard ; Laurent, Paul ; Deputier, Stephanie ; Guilloux-viry, Maryline ; Perrin, Andre ; Huret, Fabrice
Author_Institution :
LEST-UBO/ENSTBr, Brest
Abstract :
Previous investigations on KTa1-xNb2O3 (KTN) materials evidenced the need to gain insight into the dielectric properties of these films to realize tunable functions with high electrical performances. We, thus, developed a simple and efficient method to determine their dielectric properties at microwave frequencies. It is based on the measurement and analysis of coplanar waveguides (CPWs). The complex permittivity of the film was determined from a modified spectral domain approach. This method was applied, here, to evaluate the permittivity and losses of KTa0.6Nb0.4 O3 thin-films deposited on different substrates. The comparison of these results with structural analyses enabled us to observe the influence of the microstructure on the microwave dielectric properties
Keywords :
coplanar waveguides; dielectric properties; ferroelectric materials; ferroelectric thin films; microwave measurement; permittivity measurement; potassium compounds; tantalum compounds; KTN-based microwave agile devices; KTaNbO; complex permittivity; coplanar waveguides; ferroelectric materials; ferroelectric thin-films; microwave dielectric properties; microwave frequencies; permittivity measurements; spectral domain approach; wide-band characterization; Dielectric materials; Dielectric substrates; Ferroelectric films; Ferroelectric materials; Microwave devices; Niobium; Performance gain; Permittivity; Thin films; Wideband; Ferroelectric materials; Permittivity measurements; Thin films;
Conference_Titel :
Microwave Conference, 2006. 36th European
Conference_Location :
Manchester
Print_ISBN :
2-9600551-6-0
DOI :
10.1109/EUMC.2006.281073
