• DocumentCode
    3163670
  • Title

    Misra - Invited Speaker

  • Author

    Misra, Vishal

  • Author_Institution
    Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC
  • fYear
    2009
  • fDate
    3-3 April 2009
  • Abstract
    In recent years, high-k dielectrics have been successfully implemented in CMOS logic devices wherein their use has led to lower leakages, better gate control and in turn continued downscaling. While high-k dielectrics materials and process flows are continuously being fine tuned for logic devices, their applications in other non-CMOS insertion are also rapidly emerging. In this talk, we discussed our recent work on exploring high-k dielectrics for various new applications. We have realized high-k dielectrics in non-volatile memories and have exploited barrier engineering to achieve asymmetry in tunneling rates. In the area of nanocrystal FLASH memories, we have investigated ALD nanoparticle formation as a function of the high-k dielectric and have shown a strong dependence on the surface. We have also investigated these high-k dielectric stacks for improving the performance of molecular memories. We also presented the advantages of using high-k dielectrics in power semiconductor applications such as SiC MOSFETs. Finally, we summarized the outlook of some emerging nanotechnologies which can benefit from high-k dielectrics.
  • Keywords
    dielectric materials; flash memories; logic devices; random-access storage; CMOS logic device; FLASH memories; barrier engineering; gate control; high-k dielectric stacks; high-k dielectrics materials; molecular memories; nanoparticle formation; nonvolatile memories; power semiconductor application; process flow; CMOS logic circuits; Flash memory; High K dielectric materials; High-K gate dielectrics; Logic devices; MOSFETs; Nanocrystals; Nonvolatile memory; Silicon carbide; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics and Electron Devices, 2009. WMED 2009. IEEE Workshop on
  • Conference_Location
    Boise, ID
  • Print_ISBN
    978-1-4244-3551-7
  • Type

    conf

  • DOI
    10.1109/WMED.2009.4816131
  • Filename
    4816131