• DocumentCode
    3163759
  • Title

    High aspect pattern fabrication by nano imprint lithography using fine diamond mold

  • Author

    Hirai, Y. ; Yoshida, S. ; Takagi, S. ; Tanaka, Y. ; Yabe, H. ; Sasaki, K. ; Sumitani, H.

  • Author_Institution
    Coll. of Eng., Osaka Prefecture Univ., Japan
  • fYear
    2002
  • fDate
    6-8 Nov. 2002
  • Firstpage
    26
  • Lastpage
    27
  • Abstract
    Nano imprint lithography is an attractive fine lithographic method to obtain nano patterns by using low cost process and materials., Various applications have been demonstrated to utilize this fine method. One of the advantages of nano imprint lithography is that a wet development process is not required, which sometimes causes sticking errors by surface tension during wet development process. On the other hand, there is no fear of such defects by imprint lithography because a resist is mechanically deformed and released. We have demonstrated high aspect ratio pattern fabrication as high as 6.0 with 200nm in line width. But the mold is fabricated using thin Si substrate and anisotropic wet chemical etching, which cannot fabricate voluntary patterns by crystalline axis dependence.
  • Keywords
    nanolithography; pattern formation; anisotropic wet chemical etching; fine diamond mold; high aspect pattern fabrication; nanoimprint lithography; thin Si substrate; Costs; Educational institutions; Fabrication; Lithography; Optical devices; Polymers; Research and development; Resists; Substrates; Surface tension;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology Conference, 2002. Digest of Papers. Microprocesses and Nanotechnology 2002. 2002 International
  • Conference_Location
    Tokyo, Japan
  • Print_ISBN
    4-89114-031-3
  • Type

    conf

  • DOI
    10.1109/IMNC.2002.1178526
  • Filename
    1178526