DocumentCode
3164002
Title
Spatially Non-uniform, Time Varying Thermal Characterization Of VlSI Chips
Author
Cooke, B.J. ; Prince, J.L. ; Staszak, Z.J. ; Shope, D. ; Fahey, W.J.
Author_Institution
University Of Arizona
fYear
1988
fDate
22-23 Feb. 1988
Firstpage
143
Lastpage
148
Keywords
Control systems; Drives; Electronic packaging thermal management; Semiconductor device measurement; Sensor arrays; System testing; Temperature control; Temperature sensors; Thermal sensors; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
Conference_Location
Long Beach, CA, USA
Type
conf
DOI
10.1109/ICMTS.1988.672950
Filename
672950
Link To Document