• DocumentCode
    3164019
  • Title

    Electromagnetic radiation and conducted susceptibility diagnosis and analysis of vehicle electronic circuit using mixed-mode S-parameter method

  • Author

    Ho, C.-Y. ; Huang, C.-H. ; Horng, T.S.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
  • fYear
    2009
  • fDate
    7-10 Dec. 2009
  • Firstpage
    441
  • Lastpage
    444
  • Abstract
    In this paper, the radiated emission and the conducted susceptibility of vehicle electronic circuit to external radio frequency (RF) disturbances are studied using mixed-mode S-parameters method. The analytic method adopting mixed-mode S-parameters developed in this paper can be used to illustrate noise-converting phenomenon and verify successfully by the bulk current injection (BCI) test procedures. The far-field measurement and the susceptible experiment were proved by BCI test and the mixed-mode S-parameters are obtained from four-port vector network analyzer. From the verified results, the correlation of the BCI test agrees very well with the mixed-mode S-parameters method.
  • Keywords
    S-parameters; network analysers; radiowave propagation; bulk current injection test; electromagnetic radiation; external radio frequency disturbances; far-field measurement; mixed-mode S-parameter method; noise-converting phenomenon; susceptibility diagnosis; vector network analyzer; vehicle electronic circuit; Circuit testing; Delta modulation; Electromagnetic analysis; Electromagnetic interference; Electromagnetic radiation; Electronic circuits; Immunity testing; Radio frequency; Scattering parameters; Vehicles; bulk current injection; conducted susceptibility; mixed-mode S-parameters; radiated emission; radio frequency (RF) disturbances; style;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2009. APMC 2009. Asia Pacific
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-2801-4
  • Electronic_ISBN
    978-1-4244-2802-1
  • Type

    conf

  • DOI
    10.1109/APMC.2009.5384215
  • Filename
    5384215