• DocumentCode
    3164200
  • Title

    Test Vehicle For The Measurement Of Charge Collection And Soft Error rate Prediction In high-density Memories due to /spl alpha/-particle strikes

  • Author

    Oldiges, Phil ; Furuyama, Tohru ; Frey, Jeffrey

  • Author_Institution
    Cornell University
  • fYear
    1988
  • fDate
    22-23 Feb. 1988
  • Firstpage
    150
  • Lastpage
    153
  • Keywords
    Capacitors; Charge measurement; Current measurement; Density measurement; Error analysis; Monitoring; Random access memory; Testing; Vehicles; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
  • Conference_Location
    Long Beach, CA, USA
  • Type

    conf

  • DOI
    10.1109/ICMTS.1988.672951
  • Filename
    672951
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3164200