• DocumentCode
    3164284
  • Title

    Cutwidth approximation in linear time

  • Author

    Booth, Heather D. ; Govindan, Rajeev ; Langston, Michael A. ; Ramachandramurthi, Siddharthan

  • Author_Institution
    Dept. of Comput. Sci., Tennessee Univ., Knoxville, TN, USA
  • fYear
    1992
  • fDate
    28-29 Feb 1992
  • Firstpage
    70
  • Lastpage
    73
  • Abstract
    Graph width metrics have been widely studied for their relevance to VLSI design. Examples include cutwidth, pathwidth, bandwidth and several others that arise in circuit layout. When the width is bounded, graphs that satisfy these metrics can often be recognized by finite lists of obstruction tests. One of the most foundational tests is to determine whether K4 is immersed in a graph. The authors present for the first time a fast, practical algorithm to perform this test, and discuss its relevance to cutwidth and other metrics
  • Keywords
    VLSI; circuit layout CAD; graph theory; VLSI design; bandwidth; circuit layout; cutwidth approximation; graph width metrics; linear time; obstruction tests; pathwidth; Bandwidth; Character recognition; Circuit testing; Computer science; Contracts; Linear approximation; Performance evaluation; Polynomials; Tree graphs; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI, 1992., Proceedings of the Second Great Lakes Symposium on
  • Conference_Location
    Kalamazoo, MI
  • Print_ISBN
    0-8186-2610-0
  • Type

    conf

  • DOI
    10.1109/GLSV.1992.218363
  • Filename
    218363
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3164284