• DocumentCode
    3164347
  • Title

    Occurrence of new upward positive leaders triggered by negative downward CG lightning

  • Author

    Berger, Gerard ; Gallin, Louis-Jonardan ; Ait-amar, Sonia

  • Author_Institution
    Lab. of Phys. of Gases & Plasmas, Paris XI Univ., Gif-sur-Yvette, France
  • fYear
    2010
  • fDate
    11-14 Oct. 2010
  • Firstpage
    112
  • Lastpage
    115
  • Abstract
    Characterizing upward leaders is not obvious because their maximum flash intensity (some kA) is small if compared to similar LPS installed at low altitude, so the discrimination between leaders involved in lightning attachment process and those non-connecting ones is not straightforward. A simplified model of the field produced by a negative CG flash has been tested in order to predict most of the vulnerable points of neighboring structures from where upward leaders might occur. As shown earlier, a positive upward leader needs for reaching a substantial enough development to satisfy physical criteria such like a threshold field for leader inception and a threshold field for its self-sustained propagation. Analytical relationships allow to estimate the region inside which an upward leader may occur and eventually only lead to a non-connecting form. Experimental evidences will be looked for using data of Météorage, the French lightning detection network. During previous lightning season, several events inside a period of one year have been recorded, some of them being non-connecting upward leaders created at the lightning rod tip.
  • Keywords
    lightning protection; French lightning detection network; Météorage; lightning attachment process; lightning rod tip; maximum flash intensity; negative downward CG lightning; self-sustained propagation; upward positive leaders; Buildings; Clouds; Computational modeling; Lead; Lightning protection; Mathematical model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Voltage Engineering and Application (ICHVE), 2010 International Conference on
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    978-1-4244-8283-2
  • Type

    conf

  • DOI
    10.1109/ICHVE.2010.5640851
  • Filename
    5640851