DocumentCode :
316445
Title :
Emission stability analysis of cone-shaped metal-insulator-semiconductor cathode by Monte Carlo simulation
Author :
Ishikawa, J. ; Gotoh, Y. ; Sadakane, S. ; Inoue, K. ; Nagao, M. ; Tsuji, H.
Author_Institution :
Department of Electronic Science and Engineering, Kyoto University
fYear :
1997
fDate :
17-21 Aug. 1997
Firstpage :
19
Lastpage :
23
Keywords :
Acceleration; Cathodes; Electrodes; Electron emission; Elementary particle vacuum; Fluctuations; Insulation; Metal-insulator structures; Monte Carlo methods; Stability analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Microelectronics Conference, 1997. Technical Digest., 1997 10th International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-3786-7
Type :
conf
DOI :
10.1109/IVMC.1997.627380
Filename :
627380
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=316445
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