Title :
Model predictive control of atomic force microscope for fast image scanning
Author :
Rana, M.S. ; Pota, Hemanshu R. ; Petersen, Ian R.
Author_Institution :
Sch. of Eng. & Inf. Technol., Univ. of New South Wales, Canberra, ACT, Australia
Abstract :
This article presents the design of a model predictive control (MPC) scheme for fast tracking and accurate scanning of an atomic force microscope (AFM). The design of this controller is based on an identified model of the AFM piezoelectric tube (PZT) scanner. Total development of the AFM imaging and scanning speed has been illustrated through this paper by proper design and implementation of the MPC controller. Experimental results show that the MPC can increase the scanning speed significantly in contrast with the existing PI controller.
Keywords :
PI control; atomic force microscopy; physical instrumentation control; piezoelectric devices; predictive control; AFM piezoelectric tube scanner; MPC controller; PI controller; PZT; atomic force microscope; fast image scanning; model predictive control; Capacitive sensors; Electrodes; Frequency measurement; Frequency response; Imaging; Vibrations;
Conference_Titel :
Decision and Control (CDC), 2012 IEEE 51st Annual Conference on
Conference_Location :
Maui, HI
Print_ISBN :
978-1-4673-2065-8
Electronic_ISBN :
0743-1546
DOI :
10.1109/CDC.2012.6426103
