DocumentCode
3165047
Title
Fabrication of flat electrodes with nano-gaps using cluster ion beams
Author
Taniguchi, M. ; Kawai, T. ; Watanabe, K. ; Matsui, S. ; Toyoda, Noriaki ; Yamada, I. ; Kubota, T. ; Mashik, S.
Author_Institution
Inst. of Sci. & Ind. Res., Osaka Univ., Ibaraki, Japan
fYear
2002
fDate
6-8 Nov. 2002
Firstpage
152
Lastpage
153
Abstract
Recently there has been of considerable interest in developing molecular electronic devices by utilizing the ability of self-assembly to form a fixed structure. In order to evaluate electronic properties of molecular devices, it is required to make flat electrodes in which the surface of electrodes is almost parallel to that of insulating substrate, since steps between electrodes and substrates prevent from constructing a self-assembly nanostructure. We herein report fabrication processes of flat electrodes whose spacing are about 100 nm, using electron beam lithography and argon gas-cluster ion beams.
Keywords
electrodes; electron beam lithography; ionised cluster beam deposition; molecular electronics; nanocontacts; nanolithography; 100 nm; cluster ion beams; electron beam lithography; electronic properties; flat electrodes fabrication; molecular electronic devices; nano-gaps; self-assembly; Argon; Electrodes; Electron beams; Fabrication; Insulation; Ion beams; Lithography; Molecular electronics; Nanoscale devices; Self-assembly;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocesses and Nanotechnology Conference, 2002. Digest of Papers. Microprocesses and Nanotechnology 2002. 2002 International
Conference_Location
Tokyo, Japan
Print_ISBN
4-89114-031-3
Type
conf
DOI
10.1109/IMNC.2002.1178589
Filename
1178589
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