• DocumentCode
    3165047
  • Title

    Fabrication of flat electrodes with nano-gaps using cluster ion beams

  • Author

    Taniguchi, M. ; Kawai, T. ; Watanabe, K. ; Matsui, S. ; Toyoda, Noriaki ; Yamada, I. ; Kubota, T. ; Mashik, S.

  • Author_Institution
    Inst. of Sci. & Ind. Res., Osaka Univ., Ibaraki, Japan
  • fYear
    2002
  • fDate
    6-8 Nov. 2002
  • Firstpage
    152
  • Lastpage
    153
  • Abstract
    Recently there has been of considerable interest in developing molecular electronic devices by utilizing the ability of self-assembly to form a fixed structure. In order to evaluate electronic properties of molecular devices, it is required to make flat electrodes in which the surface of electrodes is almost parallel to that of insulating substrate, since steps between electrodes and substrates prevent from constructing a self-assembly nanostructure. We herein report fabrication processes of flat electrodes whose spacing are about 100 nm, using electron beam lithography and argon gas-cluster ion beams.
  • Keywords
    electrodes; electron beam lithography; ionised cluster beam deposition; molecular electronics; nanocontacts; nanolithography; 100 nm; cluster ion beams; electron beam lithography; electronic properties; flat electrodes fabrication; molecular electronic devices; nano-gaps; self-assembly; Argon; Electrodes; Electron beams; Fabrication; Insulation; Ion beams; Lithography; Molecular electronics; Nanoscale devices; Self-assembly;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology Conference, 2002. Digest of Papers. Microprocesses and Nanotechnology 2002. 2002 International
  • Conference_Location
    Tokyo, Japan
  • Print_ISBN
    4-89114-031-3
  • Type

    conf

  • DOI
    10.1109/IMNC.2002.1178589
  • Filename
    1178589