DocumentCode :
316531
Title :
Analysis of Electron Emission Degradation in Silicon Field Emitter Arrays
Author :
Song, Yoon-Ho ; Lee, Jin Ho ; Kang, Seung-Youl ; Lee, Yong-Il ; Cho, Kyoung Ik ; Yoo, Hyung Joun
Author_Institution :
Semiconductor Technology Div., Electronics and Telecommunications Research Institute
fYear :
1997
fDate :
17-21 Aug. 1997
Firstpage :
440
Lastpage :
444
Keywords :
Active matrix liquid crystal displays; Anodes; Crystallization; Current measurement; Degradation; Electron emission; Field emitter arrays; Silicon; Time measurement; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Microelectronics Conference, 1997. Technical Digest., 1997 10th International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-3786-7
Type :
conf
DOI :
10.1109/IVMC.1997.627616
Filename :
627616
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=316531
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