DocumentCode
3165768
Title
General Averaged Divergence Analysis
Author
Tao, Dacheng ; Li, Xuelong ; Wu, Xindong ; Maybank, Stephen J.
Author_Institution
Hong Kong Polytech. Univ., Hong Kong
fYear
2007
fDate
28-31 Oct. 2007
Firstpage
302
Lastpage
311
Abstract
Subspace selection is a powerful tool in data mining. An important subspace method is the Fisher-Rao linear discriminant analysis (LDA), which has been successfully applied in many fields such as biometrics, bioinformatics, and multimedia retrieval. However, LDA has a critical drawback: the projection to a subspace tends to merge those classes that are close together in the original feature space. If the separated classes are sampled from Gaussian distributions, all with identical covariance matrices, then LDA maximizes the mean value of the Kullback-Leibler (KL) divergences between the different classes. We generalize this point of view to obtain a framework for choosing a subspace by 1) generalizing the KL divergence to the Bregman divergence and 2) generalizing the arithmetic mean to a general mean. The framework is named the general averaged divergence analysis (GADA). Under this GADA framework, a geometric mean divergence analysis (GMDA) method based on the geometric mean is studied. A large number of experiments based on synthetic data show that our method significantly outperforms LDA and several representative LDA extensions.
Keywords
Gaussian distribution; arithmetic; covariance matrices; data mining; statistical analysis; Bregman divergence; Fisher-Rao linear discriminant analysis; Gaussian distributions; Kullback-Leibler divergences; arithmetic mean; covariance matrices; data mining; general averaged divergence analysis; general mean; geometric mean divergence analysis; subspace selection; synthetic data; Arithmetic; Biometrics; Computer science; Covariance matrix; Data mining; Gaussian distribution; Information systems; Linear discriminant analysis; Merging; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Data Mining, 2007. ICDM 2007. Seventh IEEE International Conference on
Conference_Location
Omaha, NE
ISSN
1550-4786
Print_ISBN
978-0-7695-3018-5
Type
conf
DOI
10.1109/ICDM.2007.105
Filename
4470254
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