• DocumentCode
    3165957
  • Title

    Improving design turnaround time via two-levels HW/SW co-simulation

  • Author

    Allara, A. ; Filipponi, S. ; Fornaciari, W. ; Salice, F. ; Sciuto, D.

  • Author_Institution
    Central Res. Lab., ITALTEL-SIT, Italy
  • fYear
    1997
  • fDate
    12-15 Oct 1997
  • Firstpage
    400
  • Lastpage
    405
  • Abstract
    The steadily growing demand of fast turnaround time will shift system tuning from physical prototyping to virtual prototyping. The paper proposes a novel approach for mixed HW-SW implementation of embedded systems, allowing high-level simulation of the overall architecture as well as a deeper analysis of timing performance by exploiting commercial VHDL CAD tools. At the higher level, functional debugging and tradeoff analysis is performed on an OCCAM-based system-level model and at the lower level a VHDL-based description for both the HW and SW is built for fine grain verification of the system. The paper introduces the two levels of simulation, showing their impact in terms of design flow management and design time
  • Keywords
    computer debugging; formal verification; hardware description languages; high level synthesis; program debugging; real-time systems; tuning; virtual machines; OCCAM-based system-level model; architecture; commercial VHDL CAD tools; design flow management; embedded systems; fine grain verification; functional debugging; high-level simulation; improved design turnaround time; system tuning; timing performance; tradeoff analysis; two-level hardware/software co-simulation; virtual prototyping; Design automation; Electronic mail; Embedded software; Embedded system; Energy management; Field programmable gate arrays; Information resources; Software development management; Software prototyping; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 1997. ICCD '97. Proceedings., 1997 IEEE International Conference on
  • Conference_Location
    Austin, TX
  • ISSN
    1063-6404
  • Print_ISBN
    0-8186-8206-X
  • Type

    conf

  • DOI
    10.1109/ICCD.1997.628901
  • Filename
    628901