• DocumentCode
    3166018
  • Title

    Automatic test structure modification

  • Author

    Golshan, Khosrow ; Shetti, S. S Mahant ; Howard, Michael

  • Author_Institution
    Texas Instruments Incorporated
  • fYear
    1988
  • fDate
    22-23 Feb. 1988
  • Firstpage
    192
  • Lastpage
    194
  • Keywords
    Automatic testing; Character generation; Circuit testing; Data analysis; Documentation; Equations; Fabrication; Geometry; Integrated circuit testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
  • Conference_Location
    Long Beach, CA, USA
  • Type

    conf

  • DOI
    10.1109/ICMTS.1988.672959
  • Filename
    672959
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3166018