DocumentCode :
3166018
Title :
Automatic test structure modification
Author :
Golshan, Khosrow ; Shetti, S. S Mahant ; Howard, Michael
Author_Institution :
Texas Instruments Incorporated
fYear :
1988
fDate :
22-23 Feb. 1988
Firstpage :
192
Lastpage :
194
Keywords :
Automatic testing; Character generation; Circuit testing; Data analysis; Documentation; Equations; Fabrication; Geometry; Integrated circuit testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
Conference_Location :
Long Beach, CA, USA
Type :
conf
DOI :
10.1109/ICMTS.1988.672959
Filename :
672959
Link To Document :
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