• DocumentCode
    3166056
  • Title

    Performance measurement and reliability of VRLA batteries. II. The second generation

  • Author

    Cantor, William P. ; Davis, Eddie L. ; Feder, David O. ; Hlavac, Mark J.

  • Author_Institution
    Test Products Inc., Shrewsbury, PA, USA
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    369
  • Lastpage
    380
  • Abstract
    This paper presents the results of capacity discharge tests on approximately 15000 VRLA cells, of primarily AGM design, representing five different US manufacturers´ “20 year design life” products. Some data are also presented on gel design cells. Just as was found by D.O Feder (see INTELEC 95, The Hague, Netherlands, IEEE, p.22-8, 1995) the cells showed significant premature capacity loss beyond 2 years of service in benign, temperature controlled environments. The cells tested generally represented designs that were too new to have been included in the earlier study. While it had been hoped that these newer design cells would have been modified to correct the early failures shown in those tested in 1995, this was apparently not to be. In accord with that study, as well as an extensive Swedish study of 35000 VRLA batteries, presented at INTELEC 95, the most significant conclusion from all these studies is that VRLA cells, regardless of manufacturer or design, demonstrate acceptable reliability for only 2 years
  • Keywords
    lead acid batteries; reliability; testing; Pb; Pb-acid valve regulated batteries; VRLA batteries reliability; benign temperature controlled environments; capacity discharge tests; capacity testing programs; gel design cells; performance measurement; premature capacity loss; Batteries; Energy storage; Life testing; Measurement; Power engineering and energy; Product design; Pulp manufacturing; Reliability engineering; System testing; Temperature control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Telecommunications Energy Conference, 1998. INTELEC. Twentieth International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-5069-3
  • Type

    conf

  • DOI
    10.1109/INTLEC.1998.793528
  • Filename
    793528