DocumentCode
3166138
Title
Solving MDPs using Two-timescale Simulated Annealing with Multiplicative Weights
Author
Abdulla, Mohammed Shahid ; Bhatnagar, Shalabh
Author_Institution
Indian Inst. of Sci., Bangalore
fYear
2007
fDate
9-13 July 2007
Firstpage
2428
Lastpage
2433
Abstract
We develop extensions of the simulated annealing with multiplicative weights (SAMW) algorithm that proposed a method of solution of finite-horizon Markov decision processes (FH-MDPs). The extensions developed are in three directions: a) Use of the dynamic programming principle in the policy update step of SAMW b) A two-timescale actor-critic algorithm that uses simulated transitions alone, and c) Extending the algorithm to the infinite-horizon discounted-reward scenario. In particular, a) reduces the storage required from exponential to linear in the number of actions per stage-state pair. On the faster timescale, a ´critic´ recursion performs policy evaluation while on the slower timescale an ´actor´ recursion performs policy improvement using SAMW. We give a proof outlining convergence w.p. 1 and show experimental results on two settings: semiconductor fabrication and flow control in communication networks.
Keywords
Markov processes; dynamic programming; learning (artificial intelligence); simulated annealing; communication networks; dynamic programming principle; finite-horizon Markov decision processes; flow control; infinite-horizon discounted-reward scenario; multiplicative weights; semiconductor fabrication; two-timescale actor-critic algorithm; two-timescale simulated annealing; Communication system control; Computational modeling; Computer simulation; Convergence; Learning; Materials requirements planning; Performance evaluation; Recursive estimation; Simulated annealing; Stochastic processes; Markov decision processes; Simulated Annealing with Multiplicative Weights; reinforcement learning; two timescale stochastic approximation;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference, 2007. ACC '07
Conference_Location
New York, NY
ISSN
0743-1619
Print_ISBN
1-4244-0988-8
Electronic_ISBN
0743-1619
Type
conf
DOI
10.1109/ACC.2007.4282586
Filename
4282586
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