DocumentCode :
3166229
Title :
Measurement Of Static Noise Immunity For STL And ISL Bipolar Logics
Author :
Chateau, Jm ; Depey, M.
Author_Institution :
Thomson Semiconducteurs
fYear :
1988
fDate :
22-23 Feb. 1988
Firstpage :
195
Lastpage :
199
Keywords :
CMOS logic circuits; Flip-flops; Leakage current; Noise measurement; Schottky diodes; Semiconductor device noise; Semiconductor diodes; Temperature; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
Conference_Location :
Long Beach, CA, USA
Type :
conf
DOI :
10.1109/ICMTS.1988.672960
Filename :
672960
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3166229
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