• DocumentCode
    3166229
  • Title

    Measurement Of Static Noise Immunity For STL And ISL Bipolar Logics

  • Author

    Chateau, Jm ; Depey, M.

  • Author_Institution
    Thomson Semiconducteurs
  • fYear
    1988
  • fDate
    22-23 Feb. 1988
  • Firstpage
    195
  • Lastpage
    199
  • Keywords
    CMOS logic circuits; Flip-flops; Leakage current; Noise measurement; Schottky diodes; Semiconductor device noise; Semiconductor diodes; Temperature; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
  • Conference_Location
    Long Beach, CA, USA
  • Type

    conf

  • DOI
    10.1109/ICMTS.1988.672960
  • Filename
    672960
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3166229