• DocumentCode
    3166444
  • Title

    Global/local modeling for PWB mechanical loading

  • Author

    Zhu, Jiansen ; Quander, Stephen ; Reinikainen, Tommi

  • Author_Institution
    Nokia, Irving, TX, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    1164
  • Lastpage
    1169
  • Abstract
    PWB assemblies are sometimes subjected to mechanical loading during their lifetime, which will cause PWB deflection and stress/strain in the assemblies. These mechanical loads may be either monotonic or cyclic. For example, assembling force may cause PWB deformation if the PWB has an initial warpage and key striking may apply a cyclic load to PWB. These mechanical loadings will increase stress/strain level inside PWB and may have an effect on interconnect, PWB, or package reliability. In order to evaluate the reliability of PWB assembly, a global/local modeling methodology was developed. In this method, a PWB with micro-scale BGAs is modeled as a global model with relatively coarse mesh, which is used to capture the deformation of PWB under mechanical loading. Both the critical package and critical solder joint can also be located based on the stress/strain distribution obtained from this global model prediction. Then the critical package is modeled as a local model with a fine mesh to capture the details of packages and interconnects. In this study, solder joints of micro-scale BGAs are modeled in detail in order to capture the detail stress/strain distribution. The deformation captured by the global model is transferred to the local model as boundary conditions. Finally, a strain energy based reliability model is proposed to estimate the life of solder joints under cyclic mechanical loading and this model was calibrated by the experimental data
  • Keywords
    assembling; ball grid arrays; bending; circuit reliability; finite element analysis; printed circuit manufacture; printed circuit testing; stress-strain relations; FEA model; PWB assemblies; PWB mechanical loading; assembling force; bending; critical package; critical solder joint; cyclic load; fine mesh; global modeling; local modeling; microscale BGA; monotonic load; package reliability; relatively coarse mesh; strain energy based reliability model; stress/strain level; Assembly; Boundary conditions; Capacitive sensors; Deformable models; Life estimation; Load modeling; Packaging; Predictive models; Soldering; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2001. Proceedings., 51st
  • Conference_Location
    Orlando, FL
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7038-4
  • Type

    conf

  • DOI
    10.1109/ECTC.2001.927973
  • Filename
    927973