• DocumentCode
    3166502
  • Title

    Method For Accurate Determinaton Of The Intrinsic Cut-off Frequency of IC Bipolar Transistors

  • Author

    Celi, D.

  • Author_Institution
    Thomson Semicondwtedrs
  • fYear
    1988
  • fDate
    22-23 Feb. 1988
  • Firstpage
    200
  • Lastpage
    203
  • Keywords
    Bipolar integrated circuits; Bipolar transistors; Carbon capture and storage; Cutoff frequency; Equations; Integrated circuit testing; Microelectronics; Packaging; Parasitic capacitance; SPICE;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
  • Conference_Location
    Long Beach, CA, USA
  • Type

    conf

  • DOI
    10.1109/ICMTS.1988.672961
  • Filename
    672961
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3166502