Title :
Method For Accurate Determinaton Of The Intrinsic Cut-off Frequency of IC Bipolar Transistors
Author_Institution :
Thomson Semicondwtedrs
Keywords :
Bipolar integrated circuits; Bipolar transistors; Carbon capture and storage; Cutoff frequency; Equations; Integrated circuit testing; Microelectronics; Packaging; Parasitic capacitance; SPICE;
Conference_Titel :
Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
Conference_Location :
Long Beach, CA, USA
DOI :
10.1109/ICMTS.1988.672961
