DocumentCode :
3166556
Title :
Selection and evaluation of materials for future system-on-package (SOP) substrate
Author :
Markondeya Raj, P. ; Shinotani, K. ; Bhattacharya, Surya ; Sundaram, Venky ; Zama, S. ; White, G.E. ; Tummala, Rao R.
Author_Institution :
Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA
fYear :
2001
fDate :
2001
Firstpage :
1193
Lastpage :
1197
Abstract :
This work deals with the selection and evaluation of candidate materials as a future base substrate for SOP. New composite materials using advanced fiber clothes and fillers were fabricated and tested to evaluate the increase in performance compared to conventional glass-epoxy substrates (FR-4). Composites built with advanced carbon-cloth having a negative thermal expansion coefficient (CTE) yielded a composite CTE of <3 ppm/°C. The composites have 2-3 times higher modulus than conventional FR-4. In order to evaluate materials with further higher modulus, metal matrix composites Al/SiC with low CTE of 7 ppm/°C and high modulus of 220 GPa were also considered. The thermomechanical reliability of the electrical interconnections was evaluated after assembling flip-chips on three different substrates by subjecting test vehicles to thermal shock treatments. The failure modes in different substrates were analyzed with optical microscopy. The stresses in the solder joints and dielectric layer were also estimated with analytical and finite element models (FEM)
Keywords :
composite materials; elastic moduli; failure analysis; finite element analysis; flip-chip devices; optical microscopy; packaging; reliability; substrates; thermal expansion; thermal shock; Al-SiC; Al/SiC metal matrix composite; C; FR-4; analytical model; carbon cloth; dielectric layer; elastic modulus; electrical interconnection; failure mode; fiber cloth; filler; finite element model; flip-chip assembly; glass-epoxy composite; internal stress; optical microscopy; solder joint; substrate material; system-on-package; thermal expansion coefficient; thermal shock; thermomechanical reliability; Assembly; Composite materials; Dielectric substrates; Inorganic materials; Materials testing; Optical fiber testing; Optical microscopy; Silicon carbide; Thermal expansion; Thermomechanical processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2001. Proceedings., 51st
Conference_Location :
Orlando, FL
ISSN :
0569-5503
Print_ISBN :
0-7803-7038-4
Type :
conf
DOI :
10.1109/ECTC.2001.927978
Filename :
927978
Link To Document :
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