DocumentCode :
3166646
Title :
Background condition effect and modified SOM with frequency hopping applied in inverse scattering
Author :
Lu, Tianjian ; Chen, Xudong
Author_Institution :
Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
fYear :
2009
fDate :
7-10 Dec. 2009
Firstpage :
976
Lastpage :
979
Abstract :
Subspace-based optimization methods (SOM) for locating scatterers have been reported recently. The positions and shapes of scatterers are reconstructed by checking the contour of permittivity. Background conditions, including the shape of domain of interest, aperture, and frequency of incident wave, have an influence on the process of permittivity reconstruction. We examine the domain shape effect through the comparison among different types of domains. We also study the effect of full and partial aperture on the performance of SOM. Single-side view (partial aperture) gives a poor result in the reconstructed permittivity at a relatively low frequency. The optimization process of SOM has been modified in order to improve the result under single-side view. General SOM takes the free space as the initial guess in the optimization process, while modified SOM uses frequency hopping, and it significantly improves the reconstruction results.
Keywords :
frequency hop communication; numerical analysis; optimisation; permittivity measurement; background condition effect; domain shape effect; free space; frequency hopping; inverse scattering; modified SOM; optimization process; partial aperture; permittivity contour; permittivity reconstruction; scatterers; single-side view; subspace-based optimization methods; Antenna measurements; Apertures; Frequency; Inverse problems; Noise robustness; Optimization methods; Permittivity; Scattering; Shape; Testing; Frequency hopping; full and partial aperture; optimization; permittivity reconstruction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2009. APMC 2009. Asia Pacific
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2801-4
Electronic_ISBN :
978-1-4244-2802-1
Type :
conf
DOI :
10.1109/APMC.2009.5384338
Filename :
5384338
Link To Document :
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