DocumentCode
3166675
Title
Practical, cost effective sub-wavelength lithography
Author
Weed, J.T.
Author_Institution
Numerical Technol. Inc., San Jose, CA, USA
fYear
2002
fDate
6-8 Nov. 2002
Firstpage
296
Lastpage
297
Abstract
This paper will briefly examine the development of above-wavelength lithography, define the currently available optical extension techniques, explore the importance of integrating these techniques and offer a practical, cost effective approach capable of extending optical lithography to well below the 65 nm technology node.
Keywords
nanolithography; photolithography; 65 nm; 65 nm technology node; cost effective sub-wavelength lithography; optical extension techniques; Costs; Inspection; Integrated optics; Lithography; Manufacturing processes; Optical materials; Physics; Pulp manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocesses and Nanotechnology Conference, 2002. Digest of Papers. Microprocesses and Nanotechnology 2002. 2002 International
Conference_Location
Tokyo, Japan
Print_ISBN
4-89114-031-3
Type
conf
DOI
10.1109/IMNC.2002.1178660
Filename
1178660
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