Detailed table of content

fYear

2008

fDate

6-9 Oct. 2008

Abstract

Presents the table of contents of the proceedings record.

Keywords

CMOS integrated circuits; CMOS technology; Laboratories; Logic gates; Random access memory; Silicon; Silicon on insulator technology;

fLanguage

English

Publisher

ieee

Conference_Titel

SOI Conference, 2008. SOI. IEEE International

Conference_Location

New Paltz, NY

ISSN

1078-621X

Print_ISBN

978-1-4244-1954-8

Type

conf

DOI

10.1109/SOI.2008.4656266

Filename

4656266

Link To Document