DocumentCode :
3166901
Title :
Fracture behaviour of flip chip solder joints
Author :
Wiese, Steffen ; Jakschik, Stefan ; Feustel, Frank ; Meusel, Ekkehard
Author_Institution :
Semicond. & Microsyst. Technol. Lab., Tech. Univ. Dresden, Germany
fYear :
2001
fDate :
2001
Firstpage :
1299
Lastpage :
1306
Abstract :
The paper presents the results of isothermal cyclic shear experiments on flip chip solder joints. Two micro shear testers have been designed and built for this task. One tester is optimised to achieve high precision. Since it is actively compensated for its finite stiffness, this tester is able to record force displacement hysteresis with a resolution of better than 1 mN and 20 nm force and displacement measurements, respectively. The second tester works very similar but fits in a UHV chamber. This way, it enables in-situ SEM observations during the test. The experiments were done exactly the same way with both machines. The experimental program consisted on two types of isothermal experiments. The first type used a cyclic triangular strain wave with constant frequency but different amplitudes as the load function. The second type used a cyclic triangular strain wave with constant amplitude but different frequencies as the load function. The strain wave amplitudes ranged from Δε=0.3%…4%, the strain wave frequencies ranged from f=0,0004 Hz … 10 Hz. The test temperature was 300 K. The investigated solder materials have been Sn63Pb37 and Sn95.5Ag4Cu0.5. In order to model crack propagation in FEM simulations, two different criteria have been tested, to develop a simple crack propagation model. The first criterion was plastic strain energy ΔWpl and the second criterion was accumulated inelastic strain εacc. The paper gives crack propagation relations for both criteria
Keywords :
ductile fracture; finite element analysis; flip-chip devices; integrated circuit packaging; plastic deformation; scanning electron microscopy; shear deformation; soldering; thermal management (packaging); thermal stress cracking; FEM simulations; SnAgCu; SnPb; accumulated inelastic strain; crack propagation model; cyclic triangular strain wave; flip chip solder joints; force displacement hysteresis; fracture behaviour; high precision; in-situ SEM; isothermal cyclic shear; micro shear testers; package reliability; plastic strain energy; thermomechanical stress; ultrahigh vacuum chamber; Capacitive sensors; Displacement measurement; Flip chip solder joints; Force measurement; Frequency; Hysteresis; Isothermal processes; Materials testing; Numerical analysis; Temperature distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2001. Proceedings., 51st
Conference_Location :
Orlando, FL
ISSN :
0569-5503
Print_ISBN :
0-7803-7038-4
Type :
conf
DOI :
10.1109/ECTC.2001.927998
Filename :
927998
Link To Document :
بازگشت