Title :
Optimization of inspection strategies by use of quality cost models
Author :
Oppermann, Martin ; Sauer, Wilfried ; Wohlrabe, Heinz ; Zerna, Thomas
Author_Institution :
Electron. Technol. Lab., Tech. Univ. Dresden, Germany
Abstract :
The main goals of duality management in all industries are customer satisfaction by delivery of defect-free products, the radical reduction of defect rates and also of quality costs in the production. Controlled technological processes are the most important way to reach these goals. These principles are standard in mechanical engineering and are in use with great success. But the properties in electronics production are different from the properties in mechanical engineering companies. The processes are difficult and many environmental influences act on these processes. These influences are very strong, especially in production of small batches of assemblies (high mix-low volume). Some processes can be uncontrolled and the defect rates go up. What can we do with these processes? This paper will give you an answer to this question. It describes quality cost models to compare the quality behaviours of different technological processes and of different inspection strategies (no inspection/Statistical Process Control (SPC)/100% inspection). The quality costS are the “measurement system” to compare the different inspection strategies with each other. The costs are calculated by the use of mathematical models the quality cost models. These models contain also the influence of pseudo defects and defect flow of the inspection processes
Keywords :
electronic equipment manufacture; inspection; quality management; statistical process control; SPC; defect flow; defect rates; defect-free products; duality management; electronics production; environmental influences; inspection strategies; mathematical models; pseudo defects; quality behaviours; quality cost models; quality costs; Cost function; Customer satisfaction; Inspection; Mathematical model; Mechanical engineering; Mechanical factors; Optimized production technology; Process control; Quality management; Standards;
Conference_Titel :
Electronic Components and Technology Conference, 2001. Proceedings., 51st
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-7038-4
DOI :
10.1109/ECTC.2001.928002