DocumentCode :
3167187
Title :
Electrical performance of compliant wafer level package
Author :
Patel, Chirag S. ; Martin, Kevin ; Meindl, James D.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2001
fDate :
2001
Firstpage :
1380
Lastpage :
1383
Abstract :
As the demand for portable and high speed communication products grows, wafer level packages with high chip-to-chip bandwidth and low package parasitics are required. A Compliant Wafer Level Package (CWLP) technology has been developed to meet the growing demand of higher electrical performance at low cost. The electrical performance of the compliant wafer level package in terms of its package parasitics and chip-to-chip bandwidth is investigated in this paper
Keywords :
packaging; chip-to-chip bandwidth; compliant wafer level package; electrical characteristics; high-speed communication product; package parasitics; portable communication product; Bandwidth; Electronics packaging; Etching; Fabrication; Lead; Polymers; Prototypes; Semiconductor device packaging; Voltage; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2001. Proceedings., 51st
Conference_Location :
Orlando, FL
ISSN :
0569-5503
Print_ISBN :
0-7803-7038-4
Type :
conf
DOI :
10.1109/ECTC.2001.928013
Filename :
928013
Link To Document :
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