A New Technique For Estimating The Transverse Dielectric Constant Of Laminated Microwave Materials

Author

Carbonini, L. ; Gallina, E. ; Pagana, E. ; Volpi, L.

Author_Institution

Selex Commun. S.p.A., Genova

fYear

2006

fDate

10-15 Sept. 2006

Firstpage

1556

Lastpage

1558

Abstract

A new technique has been developed well suited to estimate the real part of the transverse dielectric constant of laminated microwave materials. Variations in the transverse dielectric constant influence the performance of circuits and antennas for which the electric field components parallel to the laminate surface are not negligible (e.g. suspended microstrip lines (SMLs) employed in the sandwich wire antenna (SWA)). The technique is based on the correlation between phase measurements on samples of the material in a waveguide using a vector network analyzer (VNA) and analytical formulas or finite element method (FEM) simulations. The technique has been verified to provide test results which correlate quite well with resonant methods based on cavity perturbation techniques

Keywords

finite element analysis; laminates; microwave materials; network analysers; permittivity; phase measurement; cavity perturbation techniques; dielectric materials; electric field components; finite element method; laminate surface; laminated microwave materials; phase measurements; printed circuit testing; resonant methods; transverse dielectric constant; vector network analyzer; waveguide material; Antenna accessories; Circuits; Dielectric constant; Dielectric materials; Laminates; Microstrip antennas; Microstrip components; Microwave theory and techniques; Phase measurement; Wire; Dielectric materials; Finite element methods; Printed circuit testing; Waveguides;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference, 2006. 36th European

Conference_Location

Manchester

Print_ISBN

2-9600551-6-0

Type

conf

DOI

10.1109/EUMC.2006.281377

Filename

4058139