Title :
A high-performance optical spectrum monitor with high-speed measuring time for WDM optical networks
Author :
Otsuka, K. ; Maki, T. ; Sampei, Y. ; Tachikawa, Y. ; Fukushima, N. ; Chikama, T.
Author_Institution :
Fujitsu Labs. Ltd., Kawasaki, Japan
Abstract :
A high-performance optical spectrum monitor, with a 30 ms measuring time, has been developed for WDM optical networks. It is composed of a diffraction grating and a pin-photodiode array, without any mechanical moving structures, and has a high-resolution, high-accuracy, large dynamic range and low polarization dependence. Using this spectrum monitor, we have confirmed the high-speed monitoring and power control of WDM signals in an optical ADM node
Keywords :
monitoring; 30 ms; WDM optical networks; WDM signals; diffraction grating; high-performance optical spectrum monitor; high-resolution high-accuracy large dynamic range; high-speed measuring time; high-speed monitoring; low polarization dependence; mechanical moving structures; ms measuring time; optical ADM node; pin-photodiode array; power control; spectrum monitor;
Conference_Titel :
Integrated Optics and Optical Fibre Communications, 11th International Conference on, and 23rd European Conference on Optical Communications (Conf. Publ. No.: 448)
Conference_Location :
Edinburgh
Print_ISBN :
0-85296-697-0
DOI :
10.1049/cp:19971439
