• DocumentCode
    3167477
  • Title

    Sparse regularization for small objects imaging with electrical resistance tomography

  • Author

    Jia Zhao ; Feng Dong ; Chao Tan ; YanBin Xu

  • Author_Institution
    Tianjin Key Lab. of Process Meas. & Control, Tianjin Univ., Tianjin, China
  • fYear
    2013
  • fDate
    22-23 Oct. 2013
  • Firstpage
    25
  • Lastpage
    30
  • Abstract
    Electrical resistance tomography (ERT) is a technique for reconstructing internal conductivity distribution of the field from electrical measurements on the surface. It is a nonlinear and ill-posed inverse problem which is easily affected by measurement noise. In order to improve the image quality of ERT, regularization methods are used to treat this ill-posedness. The Tikhonov method, which is based on L2 regularization, is generally used to solve this problem. However, it is not suitable when the conductivity has a sharp transition because it puts smoothness to obtain stability in the image reconstruction process. Recently, sparse regularization method with L1 norm shows its powerful effects for dealing with problem that has sharp transition in conductivity distribution. Thus image reconstruction results for small objects will be discussed in this paper with L1 regularization method and L2 regularization method. Simulation results show that L1 regularization method can effectively improve the image reconstruction results of small objects. It also shows L1 regularization method is less sensitive to measurement noise.
  • Keywords
    electric impedance imaging; electrical conductivity; electrical resistivity; image reconstruction; inverse problems; medical image processing; tomography; ERT; L1 norm; L1 regularization method; L2 regularization method; Tikhonov method; electrical field; electrical measurements; electrical resistance tomography; ill-posed inverse problem; image quality; image reconstruction process; internal conductivity distribution reconstruction; measurement noise; nonlinear problem; regularization methods; small object imaging; sparse regularization method; Conductivity; Image reconstruction; Imaging; Inverse problems; Noise; Noise measurement; Voltage measurement; L1 regularization method; L2 regularization method; electrical resistance tomography; small object imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Imaging Systems and Techniques (IST), 2013 IEEE International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4673-5790-6
  • Type

    conf

  • DOI
    10.1109/IST.2013.6729656
  • Filename
    6729656