DocumentCode :
3167477
Title :
Sparse regularization for small objects imaging with electrical resistance tomography
Author :
Jia Zhao ; Feng Dong ; Chao Tan ; YanBin Xu
Author_Institution :
Tianjin Key Lab. of Process Meas. & Control, Tianjin Univ., Tianjin, China
fYear :
2013
fDate :
22-23 Oct. 2013
Firstpage :
25
Lastpage :
30
Abstract :
Electrical resistance tomography (ERT) is a technique for reconstructing internal conductivity distribution of the field from electrical measurements on the surface. It is a nonlinear and ill-posed inverse problem which is easily affected by measurement noise. In order to improve the image quality of ERT, regularization methods are used to treat this ill-posedness. The Tikhonov method, which is based on L2 regularization, is generally used to solve this problem. However, it is not suitable when the conductivity has a sharp transition because it puts smoothness to obtain stability in the image reconstruction process. Recently, sparse regularization method with L1 norm shows its powerful effects for dealing with problem that has sharp transition in conductivity distribution. Thus image reconstruction results for small objects will be discussed in this paper with L1 regularization method and L2 regularization method. Simulation results show that L1 regularization method can effectively improve the image reconstruction results of small objects. It also shows L1 regularization method is less sensitive to measurement noise.
Keywords :
electric impedance imaging; electrical conductivity; electrical resistivity; image reconstruction; inverse problems; medical image processing; tomography; ERT; L1 norm; L1 regularization method; L2 regularization method; Tikhonov method; electrical field; electrical measurements; electrical resistance tomography; ill-posed inverse problem; image quality; image reconstruction process; internal conductivity distribution reconstruction; measurement noise; nonlinear problem; regularization methods; small object imaging; sparse regularization method; Conductivity; Image reconstruction; Imaging; Inverse problems; Noise; Noise measurement; Voltage measurement; L1 regularization method; L2 regularization method; electrical resistance tomography; small object imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Imaging Systems and Techniques (IST), 2013 IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4673-5790-6
Type :
conf
DOI :
10.1109/IST.2013.6729656
Filename :
6729656
Link To Document :
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