• DocumentCode
    3167487
  • Title

    Comparison of electrical capacitance tomography sensors with internal-external electrodes

  • Author

    Ruihuan Ge ; Jiamin Ye ; Haigang Wang

  • Author_Institution
    Inst. of Eng. Thermophys., Beijing, China
  • fYear
    2013
  • fDate
    22-23 Oct. 2013
  • Firstpage
    31
  • Lastpage
    34
  • Abstract
    In this paper, an ECT sensor with 12 external electrodes and 4 internal electrodes (IEE) is designed to investigate the quality of reconstructed images in circular and annular areas. The sensitivity distribution and the capacitance between different electrode pairs are calculated using a finite element method (FEM), and then used to reconstruct images using Landweber iteration algorithm. For the circular area, three different measuring strategies are considered, and then compared with a traditional ECT sensor (EE). For the annular area, three different measuring strategies, the internal electrode with/without screen, the EE sensor are considered and compared. The results show that, the IEE sensor can improve the image quality in circular areas, and only in certain circumstances, the IEE sensor can improve the image quality in annular areas comparing with the EE sensor.
  • Keywords
    capacitance measurement; capacitive sensors; electric impedance imaging; electrodes; finite element analysis; image reconstruction; image sensors; iterative methods; ECT sensor; FEM; IEE sensor; Landweber iteration algorithm; annular area; circular area; electrical capacitance tomography; finite element method; image reconstruction quality; internal-external electrodes pair; sensitivity distribution; Correlation coefficient; Electrodes; Image reconstruction; Image sensors; Permittivity; Permittivity measurement; Sensors; Electrical capacitance tomography; image reconstruction; internal-external electrode;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Imaging Systems and Techniques (IST), 2013 IEEE International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4673-5790-6
  • Type

    conf

  • DOI
    10.1109/IST.2013.6729657
  • Filename
    6729657