DocumentCode :
3167659
Title :
Empirical risk minimization versus maximum-likelihood estimation: A case study
Author :
Meir, R.
Author_Institution :
Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
Volume :
2
fYear :
1994
fDate :
9-13 Oct 1994
Firstpage :
295
Abstract :
Considers a simple two class pattern classification problem from two points of view, namely that of empirical risk minimization and that of maximum-likelihood estimation. The main focus is on an exact solution for the generalization error resulting from the above two approaches, emphasizing mainly the finite sample behavior, which is very different for the two methods. Focusing on the case of normal input distributions and linear threshold classifiers, the author uses statistical mechanics techniques to calculate the empirical and expected (or generalization) errors for the maximum-likelihood and minimal empirical error estimation methods, as well as several other algorithms. In the case of spherically symmetric distributions within each class the author finds that the simple Hebb rule, corresponding to maximum-likelihood parameter estimation, outperforms the other more complex algorithms, based on error minimization. Moreover, the author shows that in the regime where the overlap between the classes is large, algorithms with low empirical error do worse in terms of generalization, a phenomenon known as over-training
Keywords :
pattern classification; Hebb rule; empirical risk minimization; finite sample behavior; generalization error; linear threshold classifiers; maximum-likelihood estimation; minimal empirical error estimation methods; normal input distributions; over-training; spherically symmetric distributions; statistical mechanics; two class pattern classification problem; Computer aided software engineering; Convergence; Error analysis; H infinity control; Heart; Maximum likelihood estimation; Parameter estimation; Pattern recognition; Probability distribution; Risk management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 1994. Vol. 2 - Conference B: Computer Vision & Image Processing., Proceedings of the 12th IAPR International. Conference on
Conference_Location :
Jerusalem
Print_ISBN :
0-8186-6270-0
Type :
conf
DOI :
10.1109/ICPR.1994.576923
Filename :
576923
Link To Document :
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