DocumentCode

3168015

Title

Session #8 SOI radiation effects and RF applications

Author

Iyer, Subu ; Vinet, Maud

Author_Institution

IBM, USA

fYear

2008

fDate

6-9 Oct. 2008

Firstpage

127

Lastpage

128

Keywords

Aerospace engineering; Aerospace industry; CMOS technology; Circuits; Copper; Inductors; Laboratories; Radiation effects; Radio frequency; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

SOI Conference, 2008. SOI. IEEE International

Conference_Location

New Paltz, NY

ISSN

1078-621X

Print_ISBN

978-1-4244-1954-8

Electronic_ISBN

1078-621X

Type

conf

DOI

10.1109/SOI.2008.4656327

Filename

4656327