• DocumentCode
    3168313
  • Title

    Accurate logic-level power estimation

  • Author

    Bogliolo, A. ; Ricco, B. ; Benini, L. ; De Micheli, G.

  • Author_Institution
    Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
  • fYear
    1995
  • fDate
    9-11 Oct. 1995
  • Firstpage
    40
  • Lastpage
    41
  • Abstract
    In this work we propose a more accurate model for logic-level power estimation that overcomes the limitations of previous models, while keeping computational efficiency competitive with traditional gate-level power estimation based on transition activity. Our technique exploits a BDD-based symbolic model for describing the charge and discharge of parasitic (and load) capacitance and the flow of short circuit current. Lookup tables are used only for modeling the timing behavior of the circuit (as it is commonly done in full-delay simulation), therefore power simulation only marginally increases memory usage. Our method is highly accurate also for single gate (local) power estimate, allowing the individuation of critical gates during design optimization. We have implemented our techniques using VERILOG-XL as simulation platform, therefore maintaining full compatibility with design environments based on Verilog HDL.
  • Keywords
    Boolean functions; CMOS logic circuits; capacitance; circuit analysis computing; circuit optimisation; logic CAD; table lookup; timing; BDD-based symbolic model; VERILOG-XL simulation platform; Verilog HDL design environments; design optimization; load capacitance; logic-level power estimation; lookup tables; parasitic capacitance; power simulation; short circuit current flow; timing behavior; Boolean functions; Circuit simulation; Computational efficiency; Computational modeling; Data structures; Hardware design languages; Parasitic capacitance; Short circuit currents; Table lookup; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Low Power Electronics, 1995., IEEE Symposium on
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    0-7803-3036-6
  • Type

    conf

  • DOI
    10.1109/LPE.1995.482455
  • Filename
    482455