Title :
Dimensionality reduction with the k-associated optimal graph applied to image classification
Author :
Cupertino, Thiago H. ; Carneiro, Murillo G. ; Liang Zhao
Author_Institution :
Inst. of Math. & Comput. Sci., Univ. of Sao Paulo, Sao Carlos, Brazil
Abstract :
In this paper, we aim to study the usage of different network formation methods into a graph embedding framework to perform supervised dimensionality reduction. Images are often high-dimensional patterns, and dimensionality reduction can enhance processing and also increase classification accuracy. Specifically, our technique maps images into networks and constructs two network adjacency matrices to convey information about intra-class components and inter-class penalty connections. Both matrices are inserted into an optimization framework in order to achieve a projection vector that is used to project high-dimension data samples into a low-dimensional space. One advantage of the technique is that no parameter is required, that is, there is no need to select a model for the input data. Applications on handwritten digits recognition are performed, and the proposed technique is compared to some classical network formation methods. Numerical results show the approach is promising.
Keywords :
graph theory; handwriting recognition; image classification; matrix algebra; optimisation; graph embedding framework; handwritten digits recognition; high-dimension data samples; image classification; interclass penalty connections; intraclass components; k-associated optimal graph; low-dimensional space; network adjacency matrices; network formation methods; optimization framework; projection vector; supervised dimensionality reduction; Accuracy; Handwriting recognition; Optimization; Principal component analysis; Supervised learning; Training data; Vectors; Dimensionality reduction; marginal fisher criterion; network-based learning; supervised learning;
Conference_Titel :
Imaging Systems and Techniques (IST), 2013 IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4673-5790-6
DOI :
10.1109/IST.2013.6729723