• DocumentCode
    3168945
  • Title

    Refined cartesian mesh for modeling in electrical capacitance tomography

  • Author

    Smolik, Waldemar T. ; Kryszyn, Jacek

  • Author_Institution
    Inst. of Radioelectron., Warsaw Univ. of Technol., Warsaw, Poland
  • fYear
    2013
  • fDate
    22-23 Oct. 2013
  • Firstpage
    372
  • Lastpage
    376
  • Abstract
    This paper presents modeling of electric potential distribution using a refined Cartesian mesh in electrical capacitance tomography. The application of the thickened Cartesian discretization mesh in a forward problem solver allows more accurate discrete description of cylindrical elements of tomographic sensor. The irregular structured grid enables possibility to increase precision of capacitance measurement simulations. A tree structure was used for description of refined mesh nodes to obtain fast computations. The .NET based software library was created. A set of MATLAB functions was created to provide an interface between the library and the MATLAB environment. The results of electrical field computation were presented.
  • Keywords
    bioelectric potentials; capacitance measurement; electric impedance imaging; mathematics computing; medical image processing; mesh generation; .NET based software library; MATLAB environment; MATLAB functions; capacitance measurement simulation; cylindrical element; discrete description; electric potential distribution modeling; electrical capacitance tomography; electrical field computation; irregular structured grid; refined Cartesian mesh; refined cartesian mesh; refined mesh node description; thickened Cartesian discretization mesh; tomographic sensor; tree structure; Capacitance; Electric potential; Electrodes; Finite element analysis; Mathematical model; Permittivity; Sensitivity; Electrical capacitance tomography; Electromagnetic field; FEM; Sensitivity matrix;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Imaging Systems and Techniques (IST), 2013 IEEE International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4673-5790-6
  • Type

    conf

  • DOI
    10.1109/IST.2013.6729724
  • Filename
    6729724