• DocumentCode
    3169141
  • Title

    Three-dimensional electrical capacitance tomography measurement system based on an impedance analyzer

  • Author

    Yinggang Zhou ; Delong Liu ; Hua Yan

  • Author_Institution
    Sch. of Inf. Sci. & Eng., Shenyang Technol. Univ., Shenyang, China
  • fYear
    2013
  • fDate
    22-23 Oct. 2013
  • Firstpage
    415
  • Lastpage
    418
  • Abstract
    This thesis designs a three-dimensional (3D) electrical capacitance tomography (ECT) measurement system based on an impedance analyzer. The measurement system is consisting of a 3D ECT sensor with 12 electrodes, a WK65120B impedance analyzer, a specially designed multi-channel switched system and a PC. Using the QT software to control multi-channel switch system and impedance analyzer, we can achieve the automatic capacitance measurement of 12 plates of 3D capacitance sensor without affecting the measurement accuracy, and save the measurement data on the computer. Compared with direct impedance analyzer, the measurement speed and stability are improved. Experiments show that the system can automatically measure all the 66 capacitance values generated by the 3D ECT sensor with low drift, high resolution and high accuracy.
  • Keywords
    capacitance measurement; capacitive sensors; computerised instrumentation; electric impedance imaging; electrodes; pulse height analysers; 3D ECT measurement system; 3D ECT sensor; 3D capacitance sensor; PC; QT software; WK65120B impedance analyzer; automatic capacitance measurement; electrode; multichannel switched system; stability; three-dimensional electrical capacitance tomography measurement system; Capacitance; Capacitance measurement; Electrodes; Impedance; Impedance measurement; Semiconductor device measurement; Three-dimensional displays; 3D capacitance sensor; Impedance analyzer; Multi-channel switched system; QT;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Imaging Systems and Techniques (IST), 2013 IEEE International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4673-5790-6
  • Type

    conf

  • DOI
    10.1109/IST.2013.6729733
  • Filename
    6729733