• DocumentCode
    316923
  • Title

    Generation, control and regulation of EMI from AC drives

  • Author

    Skibinski, G. ; Pankau, J. ; Sladky, R. ; Campbell, J.

  • Author_Institution
    Rockwell Autom., Allen-Bradley Co., Mequon, WI, USA
  • Volume
    2
  • fYear
    1997
  • fDate
    5-9 Oct 1997
  • Firstpage
    1571
  • Abstract
    Adjustable speed AC drive (ASD) manufacturers recently migrated from bipolar junction transistor (BJT) semiconductors to insulated gate bipolar transistors (IGBTs) as the preferred output switching device. The advantage of IGBTs is that device rise/fall time switching capability is 5-10 times faster, resulting in lower device switching losses and a more efficient and smaller drive package. However, faster output dv/dt transitions and higher drive carrier frequencies increase the magnitude of common mode (CM) electrical noise and electromagnetic interference (EMI) problems. Experience suggests all PWM drives with steep fronted output voltage waveforms have these problems. This paper provides a basic understanding of EMI generated by these drives solutions to control EMI, as well as regulation standards on allowable conducted and radiated emissions to insure a successful drive system installation
  • Keywords
    AC motor drives; DC-AC power convertors; PWM invertors; bipolar transistor switches; electromagnetic interference; insulated gate bipolar transistors; power bipolar transistors; power semiconductor switches; switching circuits; variable speed drives; EMI control; EMI generation; EMI regulation; adjustable speed AC motor drives; carrier frequencies; common mode electrical noise; conducted emissions; electromagnetic interference; insulated gate bipolar transistors; output dv/dt transitions; output switching device; radiated emissions; regulation standards; rise/fall time switching capability; steep fronted output voltage waveforms; switching losses; AC generators; Electromagnetic interference; Frequency; Insulated gate bipolar transistors; Pulse width modulation; Semiconductor device manufacture; Semiconductor device noise; Semiconductor device packaging; Switching loss; Variable speed drives;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 1997. Thirty-Second IAS Annual Meeting, IAS '97., Conference Record of the 1997 IEEE
  • Conference_Location
    New Orleans, LA
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-4067-1
  • Type

    conf

  • DOI
    10.1109/IAS.1997.629062
  • Filename
    629062