Applications of Runge-Kutta Multiresolution Time-Domain scheme in dielectric media interfaces

Author

Chen, Xinlei ; Cao, Qunsheng

Author_Institution

Coll. of Inf. Sci. & Technol., Nanjing Univ. of Aeronaut. & Astronaut. (NUAA), Nanjing, China

fYear

2009

fDate

7-10 Dec. 2009

Firstpage

1481

Lastpage

1484

Abstract

In the paper, we have discussed applications of the Runge-Kutta multiresolution time-domain scheme (RK-MRTD) in dielectric media interfaces for the first time. The RK-MRTD results have been compared with those of analysis results about the MRTD method in a media layer structure. It has been shown that the RK-MRTD scheme is more accuracy. And the application field of the RK-MRTD method is expanded. In addition, we find that the high-precision features of the RK-MRTD method could not be displayed when we use the main diagonal approximation to simplify the update equations for treating the dielectric media interfaces.

Keywords

Runge-Kutta methods; dielectric materials; materials science computing; time-domain analysis; Runge-Kutta multiresolution time-domain scheme; diagonal approximation; dielectric media interfaces; high-precision features; media layer structure; Dielectrics; Difference equations; Educational institutions; Finite difference methods; Information science; Maxwell equations; Multiresolution analysis; Paper technology; Spatial resolution; Time domain analysis; Dielectric media interface; Highorder; RK-MRTD; SSP-RK;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference, 2009. APMC 2009. Asia Pacific

Conference_Location

Singapore

Print_ISBN

978-1-4244-2801-4

Electronic_ISBN

978-1-4244-2802-1

Type

conf

DOI

10.1109/APMC.2009.5384462

Filename

5384462