DocumentCode :
3169605
Title :
Source Code Retrieval for Bug Localization Using Latent Dirichlet Allocation
Author :
Lukins, Stacy K. ; Kraft, Nicholas A. ; Etzkorn, Letha H.
Author_Institution :
Univ. of Alabama in Huntsville, Huntsville, AL
fYear :
2008
fDate :
15-18 Oct. 2008
Firstpage :
155
Lastpage :
164
Abstract :
In bug localization, a developer uses information about a bug to locate the portion of the source code to modify to correct the bug. Developers expend considerable effort performing this task. Some recent static techniques for automatic bug localization have been built around modern information retrieval (IR) models such as latent semantic indexing (LSI); however, latent Dirichlet allocation (LDA), a modular and extensible IR model, has significant advantages over both LSI and probabilistic LSI (pLSI). In this paper we present an LDA-based static technique for automating bug localization. We describe the implementation of our technique and three case studies that measure its effectiveness. For two of the case studies we directly compare our results to those from similar studies performed using LSI. The results demonstrate our LDA-based technique performs at least as well as the LSI-based techniques for all bugs and performs better, often significantly so, than the LSI-based techniques for most bugs.
Keywords :
indexing; information retrieval; software engineering; LDA-based static technique; automatic bug localization; automating bug localization; information retrieval; latent Dirichlet allocation; latent semantic indexing; source code retrieval; Aging; Computer bugs; Costs; Indexing; Information retrieval; Large scale integration; Linear discriminant analysis; Reverse engineering; Software maintenance; Software systems; LDA; LSI; bug localization; information retrieval; latent Dirichlet allocation; latent semantic indexing; program comprehension;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reverse Engineering, 2008. WCRE '08. 15th Working Conference on
Conference_Location :
Antwerp
ISSN :
1095-1350
Print_ISBN :
978-0-7695-3429-9
Type :
conf
DOI :
10.1109/WCRE.2008.33
Filename :
4656405
Link To Document :
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