• DocumentCode
    31697
  • Title

    Logic Drivers: A Propagation Delay Modeling Paradigm for Statistical Simulation of Standard Cell Designs

  • Author

    Olivieri, Mauro ; Mastrandrea, Antonio

  • Author_Institution
    Dept. of Inf. Eng. Electron. & Telecommun., Sapienza Univ. of Rome, Rome, Italy
  • Volume
    22
  • Issue
    6
  • fYear
    2014
  • fDate
    Jun-14
  • Firstpage
    1429
  • Lastpage
    1440
  • Abstract
    In nanoscale digital CMOS IC design, the large technology parameter variations have boosted the interest in statistical performance analysis. As the huge execution time of SPICE-based transistor-level Monte Carlo analysis is impractical for complex designs, there is a need for making accurate Monte Carlo analysis feasible through fast logic-level simulators. This paper presents a new, general logic model of digital CMOS cells featuring technology variation aware timing, and its prototype implementation in a standard hardware-description-language environment. The application of the approach to typical standard cells and test circuits shows very good agreement with SPICE BSIM4 transistor-level simulation both for nominal delay and for statistical Monte Carlo analyses.
  • Keywords
    CMOS logic circuits; Monte Carlo methods; VLSI; hardware description languages; integrated circuit design; logic design; Monte Carlo analysis; digital CMOS cells; hardware description language environment; logic drivers; nanoscale digital CMOS IC design; nominal delay; propagation delay modeling; standard cell designs; statistical simulation; technology variation aware timing; CMOS integrated circuits; Capacitance; Delays; Integrated circuit modeling; Propagation delay; Semiconductor device modeling; Transistors; CMOS integrated circuits; Circuit simulation; digital circuits; very large scale integration; very large scale integration.;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2013.2269838
  • Filename
    6557021