• DocumentCode
    3169824
  • Title

    Simulation of hot electron transport in semiconductor devices

  • Author

    Fernando, Chenjing L. ; Frensley, William R. ; Bowen, R. Chris

  • Author_Institution
    Erik Jonsson Sch. of Eng. & Comput. Sci., Texas Univ., Dallas, TX, USA
  • fYear
    1995
  • fDate
    7-9 Aug 1995
  • Firstpage
    343
  • Lastpage
    347
  • Abstract
    A numerical technique based on semiclassical transport theory is presented to describe highly non-equilibrium electron transport in submicron devices. Open boundary conditions, polar optical phonon scattering, and full band structures are employed in our calculation. Special treatment of the abrupt junctions of potential profile is included in our model, so is the quantum reflection occurring around heterojunctions. The technique has been incorporated into an interactive program in which users may specify a region where the calculation is to be performed. Our results show that the polar optical phonon scattering has an important impact on the electron transport in hot electron transistors
  • Keywords
    band structure; electron-phonon interactions; electronic engineering computing; finite difference methods; hot carriers; hot electron transistors; semiconductor device models; semiconductor heterojunctions; abrupt junctions; full band structures; heterojunctions; highly nonequilibrium electron transport; hot electron transistors; hot electron transport; interactive program; model; numerical technique; open boundary conditions; polar optical phonon scattering; potential profile; quantum reflection; semiclassical transport theory; semiconductor devices; submicron devices; Boundary conditions; Distribution functions; Electron optics; Equations; Heterojunctions; Optical reflection; Optical scattering; Particle scattering; Phonons; Semiconductor devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Speed Semiconductor Devices and Circuits, 1995. Proceedings., IEEE/Cornell Conference on Advanced Concepts in
  • Conference_Location
    Ithaca, NY
  • ISSN
    1079-4700
  • Print_ISBN
    0-7803-3970-3
  • Type

    conf

  • DOI
    10.1109/CORNEL.1995.482525
  • Filename
    482525