• DocumentCode
    3170126
  • Title

    DC to radio-frequency characterization of ZrO2 dielectric for “Metal-Insulator-Metal” integrated capacitors

  • Author

    Bertaud, T. ; Vallée, C. ; Bermond, C. ; Lacrevaz, T. ; Fléchet, B. ; Farcy, A. ; Blonkovski, S.

  • Author_Institution
    IMEP-LAHC, Univ. de Savoie, Le Bourget du Lac, France
  • fYear
    2009
  • fDate
    7-10 Dec. 2009
  • Firstpage
    1397
  • Lastpage
    1400
  • Abstract
    This paper deals with the electrical and wideband frequency characterizations of Metal-Insulator-Metal capacitors integrating medium-k material ZrO2. Characterizations are performed from DC up to 4 GHz on micro-strip waveguides structures. We investigate electrical performance of MIM capacitors which integrate thicknesses of 45 nm to 10 nm of ZrO2 dielectric layer. In particular, this paper focuses on the frequency effect on the voltage linearity of these capacitors. The dependence of the Voltage Capacitance Coefficient ¿ is underlined from 1 kHz to 1 GHz.
  • Keywords
    MIM devices; dielectric thin films; microstrip lines; thin film capacitors; transmission lines; waveguides; zirconium compounds; DC characterization; ZrO2; capacitors; dielectric layer; electrical characterization; frequency 1 kHz to 1 GHz; frequency 4 GHz; frequency effect; medium-¿ material; metal-insulator-metal capacitors; microstrip transmission lines; microstrip waveguides structures; radio-frequency characterization; size 45 nm to 10 nm; voltage capacitance coefficient; voltage linearity; wideband frequency characterization; Capacitance; Coplanar transmission lines; Dielectric materials; MIM capacitors; Microstrip; Radio frequency; Testing; Tin; Voltage; Zirconium; C(V) characterization; MIM capacitors; RF technology; VCC; ZrO2;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2009. APMC 2009. Asia Pacific
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-2801-4
  • Electronic_ISBN
    978-1-4244-2802-1
  • Type

    conf

  • DOI
    10.1109/APMC.2009.5384500
  • Filename
    5384500