Title :
A TSC evaluation function for combinational circuits
Author :
Bolchini, C. ; Sciuto, D. ; Salice, F.
Author_Institution :
Dipt. di Elettronica, Politecnico di Milano, Italy
Abstract :
The paper presents an innovative evaluation function for circuits with on-line detecting properties, which considers other aspects beyond area overhead. In particular, this function takes into account the probability of detecting a fault, once it occurs, with respect to the network structure and the application of input configurations. Different implementations of the same device designed to have TSC properties are compared with respect to this innovative evaluation function
Keywords :
automatic testing; combinational circuits; TSC evaluation function; combinational circuits; network structure; on-line detecting properties; totally self checking circuits; Circuit faults; Circuit synthesis; Circuit testing; Combinational circuits; Concrete; Cost function; Design methodology; Electrical fault detection; Encoding; Fault detection;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1997. ICCD '97. Proceedings., 1997 IEEE International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-8186-8206-X
DOI :
10.1109/ICCD.1997.628921
