The development of an artificial neural network embedded automated inspection quality management system

Author

Kung, Chih-Hsien ; Devaney, Michael J. ; Huang, Chung-Ming ; Kung, Chih-Ming ; Wang, Yi-jen

Author_Institution

Dept. of Inf. Manage., Chang-Jung Christian Univ., Tainan, Taiwan

Volume

2

fYear

2001

fDate

2001

Firstpage

865

Abstract

This paper describes in detail the development of an innovative artificial neural network embedded automated inspection scheme for the manufacturing industry employing digital image processing techniques. Such a system is capable of performing real-time image processing tasks and identifies the size and location of the finished components on manufactured products as well as the flaws and scratches on surface of products during the manufacturing process. The proposed artificial neural network embedded quality management system provides a user-friendly user interface that has been implemented and tested on a case study from a printed circuit board manufacture. The experimental results have demonstrated the functionality and superiority of the developed artificial neural network embedded inspection system

Keywords

automatic optical inspection; embedded systems; feature extraction; flaw detection; graphical user interfaces; image recognition; manufacturing data processing; neural nets; printed circuit manufacture; printed circuit testing; production engineering computing; quality management; ANN-embedded automated inspection; GUI; PCB manufacture; artificial neural network; digital image processing techniques; finished components; flaws; manufacturing industry; printed circuit board manufacture; quality management system; real-time image processing tasks; scratches; user-friendly interface; Artificial neural networks; Circuit testing; Digital images; Image processing; Inspection; Manufactured products; Manufacturing processes; Quality management; Real time systems; Surface finishing;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE

Conference_Location

Budapest

ISSN

1091-5281

Print_ISBN

0-7803-6646-8

Type

conf

DOI

10.1109/IMTC.2001.928200

Filename

928200