Title :
Measurement of pesticide residues in food based on diffuse reflectance IR spectroscopy
Author :
Hiroaki, Ishizawa ; Toyonori, Nishimatsu ; Eiji, Toba
Author_Institution :
Agricultural Tech. Inst., Suzaka, Japan
Abstract :
This paper describes nondestructive pesticide measurement of agricultural products based on the diffuse reflectance infrared spectroscopy (FT-IR-DR). Both FT-IR-DR spectra and the concentration of the pesticide residues were measured for real lettuce samples. Then, calibration models to estimate the residual concentration of the pesticides were derived by partial least square regression of the spectra. Cross validations of the calibration models were also carried out. It has been revealed that by using this method, it takes two minutes to measure multi-elements of pesticide residues in a sample lettuce head. A sensor system for food safety inspection could be expected based on this method
Keywords :
Fourier transform spectroscopy; agriculture; infrared spectroscopy; least squares approximations; pollution measurement; principal component analysis; reflectivity; spectrochemical analysis; spectroscopy computing; PCA; agricultural products; calibration models; chemometrics software; cross validation; diffuse reflectance IR spectroscopy; food sensor system; lettuce samples; nondestructive pesticide measurement; partial least square regression; pesticide residues; residual concentration; safety inspection; Agricultural engineering; Agricultural products; Calibration; Food technology; Infrared spectra; Least squares methods; Mirrors; Reflectivity; Spectroscopy; Textile technology;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
Conference_Location :
Budapest
Print_ISBN :
0-7803-6646-8
DOI :
10.1109/IMTC.2001.928204